Description:

Properly defining your environmental chamber requirements will insure the best ROI, the quality of your product or tests and minimize warranty problems.

Description:

IEEE 802.3af or Power Over Ethernet, like a true fieldbus, combines data and power in the same cable to simplify system wiring, reduce installation time and save you money. How does it work and where can you apply it.

Industrial cellular data modems are the equivalent of wireless Ethernet routers. Connect to your remote sites with open systems flexibility and limitless distance. Comparisons with other wireless schemes including cost and security.

Description:

Although strain gage load cell technology has its place for DC (static) force measuring and measurements requiring accuracy better than 1.0% of full scale, quartz piezoelectric force sensors offer many distinct advantages. Qualities such as long-term stability and durability are particularly important for automotive component durability testing. This paper is intended to acquaint instrumentation engineers, many of whom may not be familiar with quartz piezoelectric force sensors characteristics, with the benefits of the technology, and how to take advantage of such benefits within automotive testing applications.

Description:

Selection of non-contact displacement measurement technology depends on many factors. MTI Instruments will discuss the identification and evaluation of the factors that will help determine what measurement technology is best suited for the job. The presentation will cover the basics of Laser, Capacitance, Fiber Optic and Eddy Current technologies, and discuss how accuracy requirements, stand-off, range, frequency response, grounding, cross talk, surface effects, featuring, cost and other variables impact making successful non-contact displacement measurements.

Description:

Mike Turner of LeCroy Corporation will give an Overview of the Latest Test Methods for High Speed Serial Designs with Oscilloscope Based Solutions. He will be demonstrating what is new in high speed serial data and mixed-signal oscilloscope options (MSOs) for I2C, SPI, UART, RS232, LIN, and CAN triggering and decoding and how you can turn LeCroy oscilloscopes into all-in-one analog, digital, and serial data trigger, acquisition, and analysis machines. And techniques on how easily you can transform that information into useful reports via the LabNoteBook standard feature along with standard problem finding tools like WaveScan and WaveStream.

Description:

The ANSI Z540.3 Standard replaced the ANSI Z540.1 standard in 2006. The new requirements of this standard have created some confusion among the measurement community. This presentation will clarify the new requirements and present techniques for satisfying the new requirements.