About I.R.I.S.
Show Location
Technical Sessions
Application Notes
Show Registration
Contact IRIS
Cleveland Show
List of Exhibitors
Dytec/East
EQS Systems, LLC
EU Compliance Services, Inc.
FLUKE
Instrumentation Systems Inc. (ISI)
Measurement Instruments
Meta Technical Sales, Inc.
Micro Sales
PCB Piezotronics
RDP Corporation
Stress Analysis Services
TMS Inc.
Show Advanced Registration:
Fields Marked with a
*
are Required
Name:
*
Company:
*
Street:
*
City:
*
State:
*
Zip:
*
Mailstop:
E-mail:
*
Telephone:
*
Fax:
Technical Sessions Room A:
Time: 9:00 am to 9:45 am
Topic: Why Measure Vibration?
Presented by: Terry McCarville, PCB Field Application Engineer
Sponsored by: PCB Piezotronics
Time: 10:15 am to 11:00 am
Topic: The Evolution of Chart Recorders to Digital Data Recorders
Presented by: Phil Babuder, Central Reg Mgr., Astro-Med, Test & Measurement Group
Sponsored by: EQS Systems
Time: 1:00 pm to 1:45 pm
Topic: The Next Generation in Communication and Data I/O - The Two Technologies from Sixnet I/O that extend the reach of Ethernet and make our job easier.
Presented by: Howard Greer - Technical Product Specialist, Sixnet I/O
Sponsored by: Meta Technical Sales Inc
Technical Sessions Room B:
Time: 9:15 am to 10:00 am
Topic: Selection of Non-Contact Displacement Measurement Technology
Presented by: MTI Instruments, Inc. - Paul Slazas, Product Sales Manager
Sponsored by: Instrumentation Systems, Inc
Time: 10:30 am to 11:15 am
Topic: Properly defining your environmental chamber requirements will Insure the best ROI
Presented by: Fred Rombold – Cincinnati Sub-Zero
Sponsored by: RDP
Time: 1:15 pm to 2:00 pm
Topic: An Overview of the Latest Test Methodologies for High Speed Serial Designs with Oscilloscope Based Solutions by LeCroy
Presented by: Mike Turner with Lecroy
Sponsored by: DYTEC/East
Additional Information or Comments:
Wednesday
Show &
Technical Sessions:
9:00 am to 3:00 pm
Buffet Lunch:
11:00 am to 2:00 pm
copyright I.R.I.S. Group