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Listing for the 2008 IRIS Show Technical Sessions:

Room A:

Time: 9:00 am to 9:45 am
Topic Why Measure Vibration?
Presented by: Terry McCarville, PCB Field Application Engineer
Sponsored by: PCB Piezotronics

Description:

Why Measure Vibration- An Introduction to Applications,Practices,and Equipment. Measuring or monitoring the vibration of an object is becoming an increasingly important practice for determining performance,quality, and reliability.

This seminar will provide an overview of some of the applications in which vibration measurement or monitoring can contribute to the successful acceptance of a product or continuous running process.

 

Time: 10:15 am to 11:00 am
Topic The Evolution of Chart Recorders to Digital Data Recorders
Presented by: Phil Babuder, Central Reg Mgr., Astro-Med, Test & Measurement Group
Sponsored by: EQS Systems

Description:

It will compare how data was previously recorded almost exclusively on paper, while today’s recorders display data on built-in monitors and save data to internal memory or hard drive while also providing the ability to print data to an optional chart recorder or printer. Also being discussed is the increased necessity for higher bandwidths and sample rates and how today’s data acquisition systems meet those requirements. It will describe the different data formats available and the methods used to export data to a PC for analysis.

 

Time: 1:00 pm to 1:45 pm
Topic The Next Generation in Communication and Data I/O - The Two Technologies from Sixnet I/O that extend the reach of Ethernet and make our job easier.
Presented by: Howard Greer - Technical Product Specialist, Sixnet I/O
Sponsored by: Meta Technical Sales Inc

Description:

EEE 802.3af or Power Over Ethernet, like a true fieldbus, combines data and power in the same cable to simplify system wiring, reduce installation time and save you money. How does it work and where can you apply it.

Industrial cellular data modems are the equivalent of wireless Ethernet routers. Connect to your remote sites with open systems flexibility and limitless distance. Comparisons with other wireless schemes including cost and security.

 


Room B:
Time: 9:15 am to 10:00 am
Topic Selection of Non-Contact Displacement Measurement Technology
Presented by: MTI Instruments, Inc. - Paul Slazas, Product Sales Manager
Sponsored by: Instrumentation Systems, Inc

Description:

Selection of non-contact displacement measurement technology depends on many factors. MTI Instruments will discuss the identification and evaluation of the factors that will help determine what measurement technology is best suited for the job. The presentation will cover the basics of Laser, Capacitance, Fiber Optic and Eddy Current technologies, and discuss how accuracy requirements, stand-off, range, frequency response, grounding, cross talk, surface effects, fixturing, cost and other variables impact making successful non-contact displacement measurements.

 

Time: 10:30 am to 11:15 am
Topic Properly defining your environmental chamber requirements will Insure the best ROI
Presented by: Fred Rombold – Cincinnati Sub-Zero
Sponsored by: RDP

Description:

Properly defining your environmental chamber requirements will insure the best ROI, the quality of your product or tests and minimize warranty problems

 

Time: 1:15 pm to 2:00 pm
Topic An Overview of the Latest Test Methodologies for High Speed Serial Designs with Oscilloscope Based Solutions by LeCroy
Presented by: Mike Turner with Lecroy
Sponsored by: DYTEC/East

Description:

Mike Turner of LeCroy Corporation will give an Overview of the Latest Test Methods for High Speed Serial Designs with Oscilloscope Based Solutions. He will be demonstrating what is new in high speed serial data and mixed-signal oscilloscope options (MSOs) for I2C, SPI, UART, RS232, LIN, and CAN triggering and decoding and how you can turn LeCroy oscilloscopes into all-in-one analog, digital, and serial data trigger, acquisition, and analysis machines. And techniques on how easily you can transform that information into useful reports via the LabNoteBook standard feature along with standard problem finding tools like WaveScan and WaveStream.

 

 
 

Wednesday

Show &
Technical Sessions:
9:00 am to 3:00 pm

Buffet Lunch:
11:00 am to 2:00 pm

 
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